AVS 60th International Symposium and Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions

Session EW-WeL
Exhibitor Technology Spotlight V

Wednesday, October 30, 2013, 12:00 pm, Room Hall A
Moderator: C. Moffitt, Kratos Analytical Limited, UK


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

12:20pm EW-WeL2
High-Sensitivity, Quadrupole Mass Spectrometry Method for Measuring Water Vapour Transmission Rate (WVTR) of Barrier Membranes to 10-6 g/m2/Day using Deuterium Oxide (D2O)
S. Swann, M.P. Dobson, N. Singh, VGScienta Ltd., UK
12:40pm EW-WeL3
High Efficiency, High Capacity, and Economical “Point of Use” Gas Abatement
S. Yee, CS Clean Systems Inc., D.K. Prasad, CS Clean Systems, Inc.
1:00pm EW-WeL4
AFM and Raman Spectroscopy: Correlated Imaging and TERS
I. Armstrong, Bruker
1:20pm EW-WeL5
Can Your AFM Do This—Advanced Characterization with Asylum AFM Accessories
A. Labuda, R. Proksch, A. Moshar, Asylum Research, an Oxford Instruments company
1:40pm EW-WeL6
Nanofabrication Below 10nm Using He and Ne Ions
D. Elswick, B. Singh, Carl Zeiss Microscopy