AVS 60th International Symposium and Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions
       Session EW-WeL

Paper EW-WeL5
Can Your AFM Do This—Advanced Characterization with Asylum AFM Accessories

Wednesday, October 30, 2013, 1:20 pm, Room Hall A

Session: Exhibitor Technology Spotlight V
Presenter: A. Moshar, Asylum Research, an Oxford Instruments company
Authors: A. Labuda, Asylum Research, an Oxford Instruments company
R. Proksch, Asylum Research, an Oxford Instruments company
A. Moshar, Asylum Research, an Oxford Instruments company
Correspondent: Click to Email
Asylum Research, an Oxford Instruments company, will discuss the performance and results from a variety of AFM accessories used for advanced characterization for MFM, stress and strain measurements, and imaging in fluid. We’ll show our Variable Field Module 2 that applies in-plane magnetic fields of more than ±0.8 Tesla (8,000G) and offers ~1G field resolution. Our NanoRack™Stretching Stage applies symmetric tensile or compressive loading to samples about a central area that can be simultaneously observed with the AFM. Finally, we'll discuss the blueDrive™ Photothermal Excitation capability for Cypher™, the highest resolution fast scanning AFM. blueDrive enhances the performance of AC (tapping) mode imaging by providing extremely clean tunes in both air and water.