| AVS 58th Annual International Symposium and Exhibition | |
| Exhibitor Technology Spotlight | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:20pm | EW-TuL2 New Developments in Surface Analysis from Thermo Fisher Scientific T.S. Nunney, Richard White, A. Bushell, P. Mack, Thermo Fisher Scientific, UK |
| 12:40pm | EW-TuL3 A Complementary Approach to the Chemical and Structural Characterization of Graphene with Raman and X-ray Photoelectron Spectroscopy Tim Nunney, R.G. White, Thermo Fisher Scientific, UK, M. Wall, Thermo Fisher Scientific, K. Bolotin, Vanderbilt University, H.M. Meyer III, Oak Ridge National Laboratory |
| 1:00pm | EW-TuL4 Optimized XPS Depth Profiling of Organic Materials using Polyatomic Ion Sources D. Surman, Kratos Analytical Inc., C. Blomfield, A. Roberts, S. Page, Kratos Analytical Ltd., UK |
| 1:20pm | EW-TuL5 Advances in XPS Chemical Imaging and Depth Profiling John Hammond, D.G. Watson, P.E. Larson, S.N. Raman, Physical Electronics |