AVS 58th Annual International Symposium and Exhibition
    Applied Surface Science Division Tuesday Sessions
       Session AS-TuP

Paper AS-TuP12
Analysis of Passivated Surfaces for Mass Spectrometer Inlet Systems by Auger Electron and X-Ray Photoelectron Spectroscopy

Tuesday, November 1, 2011, 6:00 pm, Room East Exhibit Hall

Session: Applied Surface Science Poster Session
Presenter: Henry Ajo, Savannah River National Laboratory
Authors: H.M. Ajo, Savannah River National Laboratory
D.W. Blankenship, Savannah River National Laboratory
E.A. Clark, Savannah River National Laboratory
Correspondent: Click to Email

Stainless steel coupons approximately 0.5” in diameter and 0.125” thick were passivated with five different surface treatments and an untreated coupon was left as a control. These surface treatments are being explored for use in tritium storage containers. These coupons were made to allow surface analysis of the surface treatments using well-known surface analysis techniques. Depth profiles using Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) were performed on these coupons to characterize the surface and near surface regions. Scanning electron microscope (SEM) images were collected as well. All of the surface treatments studied here appear to change the surface morphology dramatically, as evidenced by lack of tool marks on the treated samples. In terms of the passivation treatment, Vendors A-D appeared to have oxide layers that were very similar in thickness to each other (0.7-0.9 nm thick) as well as the untreated samples (the untreated sample oxide layers appeared to be somewhat larger). Vendor E’s silicon coating appears to be on the order of 200 nm thick.