AVS 56th International Symposium & Exhibition
    Plasma Science and Technology Monday Sessions
       Session PS2+PV-MoM

Paper PS2+PV-MoM11
Plasma Uniformity Measurements in a Scalable, Multi-Electrode, VHF/UHF Plasma Source

Monday, November 9, 2009, 11:40 am, Room A8

Session: Plasma Processing for Photovoltaics
Presenter: D. O'Farrell, Dublin City University, Ireland
Authors: D. O'Farrell, Dublin City University, Ireland
A.R. Ellingboe, Dublin City University, Ireland
S. Linnane, Dublin City University, Ireland
C. Gaman, Dublin City University, Ireland
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The ability to deposit large area thin film amorphous silicon films using PECVD is of significant interest in a number of fields including photovoltaics and flat panel display. The desire to deposit larger area films faster has lead to a recent push towards the use of VHF/UHF frequencies which result in faster deposition rates but also result in significant film non-uniformities due to wavelength effects even over relatively small areas. Several methods have been employed in an attempt to overcome these non-uniformity issues but many barriers still exist when it comes to wide scale application. In this work a scalable, multi-electrode, VHF/UHF plasma source is described which aims to resolve these issues. Data is presented demonstrating plasma uniformity over the source for a series of powers, pressures and operating frequencies. Different operating regimes are discussed.