| AVS 55th International Symposium & Exhibition | |
| Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | SS1-ThM1 Step Etching and Restructuring on Cl2-exposed, Cl-saturated Si(001)-(2x1) R.E. Butera, J.H. Weaver, University of Illinois at Urbana-Champaign |
| 8:20am | SS1-ThM2 Ion Scattering from Au Nanoclusters formed by Buffer Layer Assisted Growth S. Balaz, J.A. Yarmoff, University of California, Riverside |
| 8:40am | SS1-ThM3 Competition Between Particle Formation and Burrowing: Gold on Bismuth P. Swaminathan, J.S. Palmer, J.H. Weaver, University of Illinois at Urbana-Champaign |
| 9:00am | SS1-ThM4 Optical Anisotropy Induced by Oblique Incidence Ion Bombardment of Ag(001) H. Wormeester, F. Everts, B. Poelsema, University of Twente, The Netherlands |
| 9:20am | SS1-ThM5 Invited Paper Producing Ultraflat Si(100) Surfaces with Aqueous Etching: STM and FTIR Yield Mechanistic Insights M.A. Hines, Cornell University |
| 10:40am | SS1-ThM9 Focused Ion Beam (FIB) Patterning and Selective Decomposition of III-V Semiconductors K.A. Grossklaus, J.M. Millunchick, University of Michigan |
| 11:00am | SS1-ThM10 Electron Induced Deposition of Amorphous Carbon Nitride Films H. Fairbrother, J.M. Gorham, J.D. Wnuk, Johns Hopkins University |
| 11:20am | SS1-ThM11 Low Energy Electron Induced Decomposition of Adsorbed Methylcyclopentadienylplatinum(IV)-trimethyl J.D. Wnuk, J.M. Gorham, Johns Hopkins University, W.F. Van Dorp, Rutgers, the State University of New Jersey, C.W. Hagen, Delft University of Technology, The Netherlands, T.E. Madey, Rutgers, the State University of New Jersey, D.H. Fairbrother, Johns Hopkins University |
| 11:40am | SS1-ThM12 A Study of the Surface Chemistry and Cross Sections for Electron Induced Dissociation using Temperature Programmed Desorption W.F. Van Dorp, Delft University of Technology, The Netherlands, S. Zalkind, B. Yakshinksiy, T.E. Madey, Rutgers, the State University of New Jersey, J.D. Wnuk, J.M. Gorham, H. Fairbrother, Johns Hopkins University, C.W. Hagen, Delft University of Technology, The Netherlands |