AVS 55th International Symposium & Exhibition
    Nanometer-scale Science and Technology Thursday Sessions

Session NS+NC-ThA
Nanolithography and Manipulation

Thursday, October 23, 2008, 2:00 pm, Room 311
Moderator: J.N. Randall, Zyvex Labs


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm NS+NC-ThA1 Invited Paper
Pattern Error Correction and Density Multiplication by Lithographically Guided Self Assembly
R. Ruiz, E.A. Dobisz, D.S. Kercher, T.R. Albrecht, Hitachi Global Storage Technologies Inc., H. Kang, F.A. Detcheverry, J.J. de Pablo, P.F. Nealey, University of Wisconsin
2:40pm NS+NC-ThA3
Patterning Self-Assembled Monolayers of Thiols Down to the sub-10 nm Scale by Scanning Tunneling Microscopy
C. Shen, M. Buck, University of St. Andrews, UK
3:00pm NS+NC-ThA4
A Novel Nanolithography Technique for Formation of Uniform Nanostructures
W. Wu, D. Dey, O. Memis, A. Katsnelson, H. Mohseni, Northwestern University
3:20pm NS+NC-ThA5
Fabrication of Large Area Glass Submicron Pattern by Multibeam Interference Lithography and Reactive Ion Etching
H.S. Jee, University at Buffalo, A.P. Zhang, Zhejiang University, China, R. Burzynski, Laser Photonics Technology Inc., K.T. Kim, P.N. Prasad, Y.K. Yoon, University at Buffalo
4:00pm NS+NC-ThA7 Invited Paper
STM Atom and Molecule Manipulation: Realizing Single Molecule Switches and Devices
S.-W. Hla, Ohio University
4:40pm NS+NC-ThA9
Nanopatterning of Functional Polymers by Thermal Dip-Pen Nanolithography
W.K. Lee, Naval Research Laboratory, W.P. King, University of Illinois, Urbana-Champaign, L.J. Whitman, National Institute of Standards and Technology, P.E. Sheehan, Naval Research Laboratory
5:00pm NS+NC-ThA10
Selective Assembly of DNA-Templated Nanostructures for the Application to Nano-Device
H.J. Kim, Y. Roh, B. Hong, Sungkyunkwan University, Korea
5:20pm NS+NC-ThA11
High Resolution STM Imaging and Manipulation of Multi-decker Porphyrin
H. Tanaka, Osaka University, Japan, T. Ikeda, Kyushu University, Japan, M. Takeuchi, NIMS, Japan, S. Shinkai, Kyushu University, Japan, T. Kawai, Osaka University, Japan