AVS 55th International Symposium & Exhibition
    In Situ Microscopy and Spectroscopy: Interfacial and Nanoscale Science Topical Conference Thursday Sessions

Session IS+NC-ThA
In Situ Microscopy - Dynamic Nanoscale Processes

Thursday, October 23, 2008, 2:00 pm, Room 310
Moderator: D.J. Miller, Argonne National Laboratory


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm IS+NC-ThA1 Invited Paper
In-situ Electromagnetic Field Experiments in the Analytical Electron Microscope
N.J. Zaluzec, D.J. Miiller, Argonne National Laboratory
2:40pm IS+NC-ThA3 Invited Paper
In-Situ Electron Microscopy Enabled by a TEM-SPM Platform
J. Huang, Sandia National Laboratories
3:20pm IS+NC-ThA5
Investigating Sliding-induced Graphitization of Diamond-like Carbon Films by In Situ TEM
A. M'ndange-Pfupfu, L.D. Marks, Northwestern University, O.L. Eryilmaz, A. Erdemir, Argonne National Laboratory
4:00pm IS+NC-ThA7 Invited Paper
Kinetics of Individual Nucleation Events during Nanoscale Vapor-Liquid-Solid Growth
F.M. Ross, IBM T. J. Watson Research Center
4:40pm IS+NC-ThA9 Invited Paper
Atomic Resolution In-Situ Environmental Transmission Electron Microscopy on Nanostructures
X.F. Zhang, Hitachi High Technologies America, Inc., T. Kamino, Hitachi High Technologies Corp., Japan
5:20pm IS+NC-ThA11
In-Situ Transmission Electron Microscopy Studies of Chemical and Thermal Stabilities of Carbon-Coated Titania Nanoparticles
M. Pozuelo, University of California, Los Angeles, X.F. Zhang, Hitachi High Technologies America, Inc., J.H. Park, University of California Los Angeles, R. Koc, Southern Illinois University at Carbondale, S. Kodambaka, University of California, Los Angeles