| AVS 55th International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-WeM1 Near Real-time Analysis of XPS Data A.S. Lea, D.R. Sisk, M.H. Engelhard, Pacific Northwest National Laboratory, J.E. Castle, University of Surrey, UK, D.R. Baer, Pacific Northwest National Laboratory |
| 8:20am | AS-WeM2 Data Scaling for Quantitative Imaging XPS J. Walton, The University of Manchester, UK, N. Fairley, Casa Software |
| 8:40am | AS-WeM3 Invited Paper Using Multivariate Analysis and Modeling for Structure-to-Property Relationships Built from XPS Data K. Artyushkova, J.E. Fulghum, P. Atanassov, The University of New Mexico |
| 9:20am | AS-WeM5 Identification and Quantification of ToF-SIMS Images with Topography using Multivariate Analysis J.L.S. Lee, I.S. Gilmore, National Physical Laboratory, UK, I.W. Fletcher, Intertek MSG, UK, M.P. Seah, National Physical Laboratory, UK |
| 9:40am | AS-WeM6 Methods for Reducing Topographical Influences in ToF-SIMS Spectral Images J.A. Ohlhausen, M.R. Keenan, Sandia National Laboratories |
| 10:40am | AS-WeM9 The Effects of Pre-Processing of Secondary Ion Mass Spectrometry (SIMS) Image Data on Self-Modeling Image Analysis W. Windig, B.M. Wise, Eigenvector Research, Inc., M.R. Keenan, Sandia National Laboratories |
| 11:00am | AS-WeM10 Comparison of MAF and PCA for Processing 3-D ToF-SIMS Images of Organic and Biological Samples B.J. Tyler, University of the West Indies, Trinidad and Tobago |
| 11:20am | AS-WeM11 SVD + Factor Rotation: A Powerful Alternative to PCA for Spectral Image Analysis M.R. Keenan, Sandia National Laboratories |
| 11:40am | AS-WeM12 A Comparison of Multivariate Statistical Analysis Protocols for ToF-SIMS Spectral Images V.S. Smentkowski, S.G. Ostrowski, General Electric Global Research Center, M.R. Keenan, Sandia National Laboratories |