| AVS 55th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-TuM1 Important Variables in Polymer Analysis with Cluster Beams C.M. Mahoney, National Institute of Standards and Technology |
| 8:20am | AS-TuM2 Expanding the Application of C60 in TOF-SIMS Depth Profile Analysis G.L. Fisher, J.S. Hammond, Physical Electronics, S. Iida, ULVAC-PHI, Japan, S.N. Raman, J.F. Moulder, S.R. Bryan, Physical Electronics |
| 8:40am | AS-TuM3 Invited Paper Three-dimensional Sputter Depth Profiling of Molecular Structures: Prospects and Limitations A. Wücher, University of Duisburg-Essen, Germany |
| 9:20am | AS-TuM5 Comparison of Cluster Ion Sources for XPS Sputter Depth Profiling of Organic Materials S.J. Hutton, I.W. Drummond, S.C. Page, Kratos Analytical Ltd, UK |
| 9:40am | AS-TuM6 The Effect of Cluster Ion Analysis Fluence on Interface Quality in SIMS Molecular Depth Profiling C. Szakal, National Institute of Standards and Technology, S. Hues, Micron Technology, J. Bennett, ATDF, G. Gillen, National Institute of Standards and Technology |
| 10:40am | AS-TuM9 ToF-SIMS Dual Beam Depth Profiling and Imaging of Human HeLa Cells J. Brison, D.S.W. Benoit, P.S. Stayton, L.J. Gamble, D.G. Castner, University of Washington |
| 11:00am | AS-TuM10 Strong Field Laser Postionization Imaging and Depth Profiling Using C60 Cluster Ion Beams D. Willingham, N. Winograd, The Pennsylvania State University |
| 11:20am | AS-TuM11 Molecular Depth Profile of Sugar Films: A Comparison Study of C60 Ions and Traditional Cs+ and O2+ Ions Z. Zhu, P. Nachimuthu, Pacific Northwest National Laboratory |
| 11:40am | AS-TuM12 Surface Domain Analysis of a Blended Polymer System Using ToF-SIMS D.D. Wells, J.A. Gardella Jr., University at Buffalo |