| AVS 55th International Symposium & Exhibition | |
| Thin Film | Thursday Sessions |
| Session TF-ThP |
| Session: | Aspects of Thin Films |
| Presenter: | M. Flores, Universidad de Guadalajara, Mexico |
| Authors: | M. Flores, Universidad de Guadalajara, Mexico J. Avalos, UAM-I, Mexico L. Huerta, UNAM, Mexico R. Escamilla, UNAM, Mexico |
| Correspondent: | Click to Email |
In this work we report the results of studies of the influence of Pt layers on the corrosion resistance of TiAL/TiALN multilayers deposited on 316L stainless steel. The multilayers were deposited by magnetron sputtering using targets of TiAL and Pt. The thickness of the Pt layers was from 50 nm to 500nm. The corrosion was studied using open circuit potential measurements and potentiodinamyc polarizations in ringer solutions. The results indicate that the corrosion resistance of TiAL/TiAlN multilayers is improved when Pt layers are deposited. The structure of multilayers was studied by means of XRD analysis. It was found that Pt layer has a strong influence on the structure of subsequent TiAlN layer. The corroded surface was studied by means of SEM and EDS. Pitting corrosion was observed in TiAl/AlTiN multilayers analyzed samples. RBS depth analysis was useful to determine the composition of each film and for modeling the interface characteristics through the heterostructure.