AVS 55th International Symposium & Exhibition | |
MEMS and NEMS | Monday Sessions |
Session MN+NC-MoA |
Session: | Fabrication at the Micro- and Nano- Scales for MEMS/NEMS |
Presenter: | R. Barton, Cornell University |
Authors: | R. Barton, Cornell University S.S. Verbridge, Cornell University B.R. Ilic, Cornell University H.G. Craighead, Cornell University J.M. Parpia, Cornell University |
Correspondent: | Click to Email |
We have developed a fabrication process for suspended nanomechanical beam structures which allows precise control over the clamping conditions, particularly the extent of the overhanging support which results from the usual sacrificial release of such devices. We localize the sacrificial silicon dioxide material to specified locations using a process involving a chemical mechanical polishing step, followed by a deposition and patterning of the structural silicon nitride material. With proper alignment of the beam structures, we have succeeded in controlling or entirely eliminating the overhang which was previously thought to potentially impact the overall dissipation in these resonant systems. We will demonstrate that for a moderate overhang, on the order of ten percent of the resonator length, dissipation measured in terms of resonator quality factor, Q, is not significantly affected either in vacuum or ambient air. This finding demonstrates that neither the intrinsic material damping at low pressure, or the gas-related damping that is dominant at higher pressures are affected by the support overhang that inevitably results from typical release steps. We anticipate that the control over the clamping conditions we present could prove useful for more complex nanosystems, for example suspended fluid-containing nanochannels which integrate both optical and mechanical means of biomolecular detection.