AVS 55th International Symposium & Exhibition | |
Graphene Topical Conference | Monday Sessions |
Session GR+SS+NC-MoA |
Session: | Materials Issues in Graphene from SiC |
Presenter: | G.M. Rutter, Georgia Institute of Technology |
Authors: | G.M. Rutter, Georgia Institute of Technology P.N. First, Georgia Institute of Technology J.A. Stroscio, National Institute of Standards and Technology |
Correspondent: | Click to Email |
Two-dimensional electron systems have been of interest to scientists for many years. From high-electron mobility transistors to novel topological quasiparticles of the fractional quantum Hall effect, the field continues to be rich in scientific possibilities and technological pay-offs. To date, most high-mobility 2D electron systems have been created at an interface between semiconductor heterostructures, making them inaccessible to the electron spectroscopies of surface science. Here we investigate graphene, a new 2D electron system that is accessible to surface studies. Our measurements use scanning tunneling microscopy and spectroscopy to elucidate the properties of epitaxial graphene, resolving heterogeneities at the level of single atoms. In this work, epitaxial graphene is created on silicon carbide wafers by thermal annealing in vacuum. Sequential scanning tunneling microscopy (STM) and spectroscopy (STS) are performed in ultrahigh vacuum at temperatures of 4.2 K and 300 K. These atomic-scale studies address the initial growth of single-layer epitaxial graphene and the role that the interface and defects play in the electronic properties of graphene. Our work shows evidence of graphene formation by mass transfer of carbon, indicated by step edge growth and the nucleation of graphene islands. STM topographic images of single-layer graphene show the atomic structure of the graphene and the graphene/SiC interface, as well as the character of defects and adatoms within and below the graphene plane.1,2 STS of lattice defects on single-layer graphene show localized peaks in the spectra. The energy position of such localized states offers a clue to the defect’s origin and composition and will be discussed.
1G. M. Rutter, et al., Phys. Rev. B 76, 235416 (2007).
2G. M. Rutter, et al., J. Vac. Sci. Technol. A in press, (2008).