| AVS 55th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuP |
| Session: | Aspects of Surface Analysis Poster Session |
| Presenter: | Y. Zhang, University of Nevada, Las Vegas |
| Authors: | A. DeMasi, Boston University L.F.J. Piper, Boston University Y. Zhang, University of Nevada, Las Vegas K.E. Smith, Boston University |
| Correspondent: | Click to Email |
Metal-based phthalocyanines (M-Pc) have become both fundamentally and technologically important.[S. Heutz et al., Adv. Mat. 19, 3618 (2007)] Here we report of recent synchrotron-based soft x-ray spectroscopy measurements of copper hexadecafluoro phthalocyanine (F16CuPc). Resonant x-ray emission spectroscopy (RXES) enables bulk, element and orbital-specific information of states near the Fermi level. We have examined the C, N, and F K-edges of thin films deposited in-vacuo, measured within our experimental endstation at the undulator beamline X1B at the National Synchrotron Light Source. Direct comparisons are made to earlier x-ray absorption and emission spectroscopy measurements of CuPc.[J. Downes et al., Chem. Phys. Lett. 390, 203 (2004)]. We focus on the C K-edge RXES of F16CuPc, and make comparisons with recent ultraviolet photoemission spectra and spin-polarized theoretical computations of non-fluorinated CuPc and F16CuPc.