| AVS 55th International Symposium & Exhibition | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuP |
| Session: | Aspects of Surface Analysis Poster Session |
| Presenter: | J.L. Fenton, The Dow Chemical Company |
| Authors: | J.L. Fenton, The Dow Chemical Company J. Chen, The Dow Chemical Company |
| Correspondent: | Click to Email |
The molecular weight of a polymer can alter the properties of films as low molecular weight components migrate to the polymer surface. XPS (x-ray photoelectron spectroscopy) is an ideal method to characterize the surface for the presence of low molecular weight polymers. XPS valance band spectra have been shown to be an excellent method to quantify the amount of propylene or ethylene at the surface of ethylene-propylene blends. Valance band spectra can also be used to detect changes due to secondary structure. The work presented here shows how XPS can identify the changes in the valance band due to MW.