AVS 55th International Symposium & Exhibition
    Applied Surface Science Monday Sessions
       Session AS-MoA

Paper AS-MoA3
2-Dimensional X-Ray Photoelectron Spectroscopy for Composite Surface Analysis

Monday, October 20, 2008, 2:40 pm, Room 207

Session: Electron Spectroscopies
Presenter: S. Suzer, Bilkent University, Turkey
Correspondent: Click to Email

We describe a method for obtaining 2-Dimensional X-Ray Photoelectron Spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the binding energy positions via the electrical potentials developed as a result of charging. By using the frequency dependence of the peaks and their cross-correlations, our technique enables us to elucidate electrical characteristics of surface structures of composite samples and bring out various correlations between hidden/overlapping peaks. Application of this technique to various composite surface structures will be presented, and discussed.