AVS 54th International Symposium
    Plasma Science and Technology Thursday Sessions

Session PS1-ThA
Plasma Diagnostics II

Thursday, October 18, 2007, 2:00 pm, Room 606
Moderator: C.B. Labelle, Advanced Micro Devices, Inc.


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:00pm PS1-ThA1
Development of Atomic Radical Monitoring Probe for Spatial Distribution Measurements and its Application to Reactive Plasma Processes
S. Takashima, Nagoya University, Japan, S. Takahashi, K. Yamakawa, S. Den, Katagiri Engineering Co., Ltd., Japan, H. Kano, NU-EcoEngineering Co., Ltd., Japan, M. Hori, Nagoya University, Japan
2:20pm PS1-ThA2
Measurement of Absolute Density of Argon Metastables by using Laser Adsorption Spectroscopy
T. Ohba, T. Makabe, KEIO University, Japan
2:40pm PS1-ThA3
Gas Phase Studies of CH3OH Plasmas Using Optical Emission Spectroscopy
K.J. Trevino, E.R. Fisher, Colorado State University
3:00pm PS1-ThA4
Measurement of the Gas Temperature Distribution in UHF-ECR Dielectric Etching System
H. Kobayashi, K. Yokogawa, K. Maeda, M. Izawa, Hitachi, Ltd., Japan
3:40pm PS1-ThA6
Research at CPMI Towards Making EUVL a Success
D.N. Ruzic, S.N. Srivastava, K.C. Thompson, H. Shin, J.R. Sporre, E.R. Ritz, University of Illinois at Urbana-Champaign
4:00pm PS1-ThA7
Inductively Coupled Plasma Radio Frequency Electrical Characteristic Measurement for Deposition of CNTs.
W.-C. Chen, Academia Sinica, Taiwan, C. Mahony, University of Ulster, UK, K.-H. Chen, Academia Sinica, Taiwan, L.-C. Chen, National Taiwan University
4:20pm PS1-ThA8 Invited Paper
Process Control through Diagnostics and Understanding: Multi-frequency Discharges and Atmospheric Pressure Plasmas
T. Gans, Queen's University Belfast, UK