AVS 54th International Symposium
    Nanometer-scale Science and Technology Tuesday Sessions

Session NS-TuM
Imaging of Nanostructures

Tuesday, October 16, 2007, 8:00 am, Room 616
Moderators: N.P. Economou, Carl Zeiss SMT, S. Hasegawa, University of Tokyo, Japan


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am NS-TuM1 Invited Paper
Atomic-Scale Studies of Complex Oxide Interfaces Using Aberration-Corrected Z-Contrast Imaging and EELS
R.F. Klie, G. Yang, University of Illinois - Chicago
8:40am NS-TuM3
In-situ Observation of Active Electronic Devices using Electrically Biased TEM Holder
D.S. Ko, S.D. Kim, Seoul National University, Republic of Korea, X.S. Li, K.S. Park, Y.K. Kim, Samsung Advanced Institute of Technology, Republic of Korea, C.G. Park, National Center for Nanomaterials and Technology, Republic of Korea, Y.W. Kim, Seoul National University, Republic of Korea
9:00am NS-TuM4
Measuring Atomic Size Objects on Electrically Insulating Surfaces in Ultrahigh Vacuum
S.C. Fain, N. Ruzycki, J. Morales, T.C. Lovejoy, E.N. Yitamben, M.A. Olmstead, F.S. Ohuchi, University of Washington
9:20am NS-TuM5
Ambient Dynamic Mode AFM Non-contact Operating Regime Determination
C.C. Wang, B. Liu, B. Leung, Y. Uritsky, Applied Materials Inc.
9:40am NS-TuM6
Atomic Resolution AFM with a Purely Electrical QPlus Sensor
B. Uder, M. Maier, A. Bettac, A. Feltz, Omicron NanoTechnology, Germany
10:40am NS-TuM9 Invited Paper
Imaging Performance Variations in Organic Solar Cells with Time-Resolved Electrostatic Force Microscopy and Photocurrent-sensitive Atomic Force Microscopy
D.S. Ginger, University of Washington
11:20am NS-TuM11
Investigation of Charge Trapping in GaN Films using Scanning Kelvin Probe Microscopy and Conductive Atomic Force Microscopy
J.C. Moore, M.A. Reshchikov, J. Xie, H. Morkoc, A.A. Baski, Virginia Commonwealth University
11:40am NS-TuM12
Sinc or Sine? The Band Excitation Method and Energy Dissipation Measurements by SPM
S. Jesse, S.V. Kalinin, Oak Ridge National Laboratory
12:00pm NS-TuM13
Electromechanical Imaging, Polarization Switching, and Intermittent-Contact PFM in a Liquid Environment
B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, Oak Ridge National Laboratory