| AVS 54th International Symposium | |
| Exhibitor Workshops | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 3:20pm | EW-TuA6 High Speed, High Resolution XPS Imaging C. Blomfield, S. Page, S. Hutton, D. Surman, Kratos Analytical |
| 3:40pm | EW-TuA7 Chemical Sample Characterisation on the Nanoscale: Imaging XPS with Ultimate Spatial Resolution M. Green, M. Maier, Omicron NanoTechnology, Germany |