|AVS 54th International Symposium|
|Exhibitor Workshops||Tuesday Sessions|
Click a paper to see the details. Presenters are shown in bold type.
High Speed, High Resolution XPS Imaging
C. Blomfield, S. Page, S. Hutton, D. Surman, Kratos Analytical
Chemical Sample Characterisation on the Nanoscale: Imaging XPS with Ultimate Spatial Resolution
M. Green, M. Maier, Omicron NanoTechnology, Germany