AVS 54th International Symposium
    Electronic Materials and Processing Thursday Sessions

Session EM-ThM
Zinc Oxide

Thursday, October 18, 2007, 8:00 am, Room 612
Moderator: R.M. Wallace, University of Texas at Dallas


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am EM-ThM1 Invited Paper
Bulk and Surface Impurities and Point Defects in ZnO
D.C. Look, Wright State University
8:40am EM-ThM3
Correlation of Native Point Defects to Thermal Stability of Schottky Barrier Formation at Metal-ZnO Interfaces
H.L. Mosbacker, C. Zgrabik, S. El Hage, The Ohio State University, A. Swain, Columbus School For Girls, M. Kramer, The Ohio State University, G. Cantwell, J. Zhang, J.J. Song, Zn Technology, D.C. Look, Wright State University, L. Brillson, The Ohio State University
9:00am EM-ThM4
Separation of Surface and Bulk Conduction in ZnO using Variable Magnetic Field Hall Effect Measurements
C.H. Swartz, M.W. Allen, S.M. Durbin, University of Canterbury, New Zealand, T.H. Myers, West Virginia University
9:20am EM-ThM5
Nuclear Reaction Analysis Investigation of H-doped ZnO Grown by Pulsed Laser Deposition
Y.J. Li, T.C. Kaspar, T.C. Droubay, S. Shutthanandan, S. Thevuthasan, P. Nachimuthu, S.A. Chambers, Pacific Northwest National Laboratory
9:40am EM-ThM6
Effects of Hydrogen Ambient and Film Thickness on ZnO:Al Electrical Properties
J.N. Duenow, Colorado School of Mines, T.A. Gessert, National Renewable Energy Laboratory, D.M. Wood, Colorado School of Mines, T.J. Coutts, National Renewable Energy Laboratory
10:00am EM-ThM7
Metallic Conductivity in Transparent Al:ZnO Films
O. Bamiduro, A.K. Pradhan, Norfolk State University
10:20am EM-ThM8
Mixed Anion ZnOTe Thin Films by Pulsed Laser Deposition
W. Wang, W. Bowen, J. Phillips, The University of Michigan Ann Arbor
10:40am EM-ThM9
STM, LEED and ARXPS Study of MOCVD Grown a-plane ZnO and MgxZn1-xO (0 <= x <= 0.3) Thin Films
O. Dulub, E.H. Morales, U. Diebold, Tulane University, G. Saraf, Y. Lu, Rutgers University