| AVS 54th International Symposium | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-WeM1 Invited Paper Local Chemical Measurements with the Scanning Tunneling Microscope P.S. Weiss, The Pennsylvania State University |
| 8:40am | AS-WeM3 Chemical Characterisation on the Nanoscale: Imaging XPS and Scanning Auger Microscopy with Ultimate Spatial Resolution M. Maier, T. Berghaus, D. Funneman, K. Winkler, Omicron NanoTechnology, Germany, N. Barrett, CEA-DSM/DRECAM/SPCSI, CEA Saclay, France, O. Renault, CEA-Leti, Minatec, France |
| 9:00am | AS-WeM4 Application of Chemical Imaging in the Pharmaceutical Industry X. Dong, C.A.J. Kemp, Eli Lilly and Company |
| 9:20am | AS-WeM5 Invited Paper In-situ Surface Analysis by Optical Means C.M. Eggleston, University of Wyoming |
| 10:40am | AS-WeM9 Synchrotron Radiation Induced X-ray Photoelectron Emission Microscopy (SR-XPEEM) with Aberration Corrected Energy Filterin N. Barrett, CEA-Saclay, FR, O. Renault, CEA LETI Minatec, FR, L.-F. Zagonel, CEA Saclay, FR, A. Bailly, CEA LETI Minatec, FR, J. Charlier, J. Leroy, CEA Saclay, FR, J.C. Cezar, N. Brookes, ESRF, FR, M. Senoner, Fed. Inst. Mtls Testing, Germany, J. Maul, T. Berg, F. Schertz, G. Schönhense, Univ. of Mainz, Germany |
| 11:00am | AS-WeM10 Directed Growth of Ordered Metal Nanostructures on Crystalline Cellulose Templates G.J. Exarhos, Y. Shin, Pacific Northwest National Laboratory |
| 11:20am | AS-WeM11 Invited Paper Critical Issues Concerning the Use of Nanomaterials In Aerospace Platforms P.T. Lillehei, NASA Langley Research Center |
| 12:00pm | AS-WeM13 Functionalization and Characterization of Gold Nanoparticles S.D. Techane, L.J. Gamble, D.G. Castner, University of Washington |