| AVS 54th International Symposium | |
| Applied Surface Science | Wednesday Sessions |
| Session AS-WeM |
| Session: | Chemical Imaging at High Spatial Resolution and Nanoscale Materials |
| Presenter: | X. Dong, Eli Lilly and Company |
| Authors: | X. Dong, Eli Lilly and Company C.A.J. Kemp, Eli Lilly and Company |
| Correspondent: | Click to Email |
Chemical imaging methods have seen increased utilization within the pharmaceutical industry due to their ability to provide insight into the composition and product performance of solid oral dosage forms. The primary imaging tools used for this type of characterization include EDS, NIR, Raman, NMR, and TOF-SIMS. This presentation will focus on the use of imaging tools for studying the detailed composition of dosage forms and packaging materials, and the inhomogeneous discoloration of API stored in USP-approved materials. Additionally, data will show that TOF-SIMS can be a pivotal tool for trouble-shooting by combining high mass resolution spectra with high spatial resolution images. The strengths and limitations of various imaging techniques (chemical and physical) will also be discussed.