AVS 54th International Symposium
    Applied Surface Science Tuesday Sessions

Session AS+BI+NS-TuM
Surface Analysis and Related Methods for Biological Materials

Tuesday, October 16, 2007, 8:00 am, Room 610
Moderator: J. Soares, University of Illinois at Urbana-Champaign


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am AS+BI+NS-TuM1 Invited Paper
Nano-bio Chemical Image of Single Cells and Tissues for Bio-medical Applications
D.W. Moon, T.G. Lee, J.Y. Lee, Korea Research Institute of Standards and Science
8:40am AS+BI+NS-TuM3
SIMS Imaging of Polymer Membranes and Single Cells
G. Jiang, R. Michel, D.J. Responte, L. Mayorga, K. Greenland, T.N. Davis, T.A. Horbett, D.G. Castner, University of Washington
9:00am AS+BI+NS-TuM4
Surface Energy Control Within Copolymer Libraries Synthesised as Micro Arrays for Biological Screening
M. Taylor, A.J. Urquhart, The University of Nottingham, UK, D.G. Anderson, R. Langer, Massachusetts Institute of Technology, M.C. Davies, M.R. Alexander, The University of Nottingham, UK
9:20am AS+BI+NS-TuM5
Surface Characteristics of Listeria Monocytogenes Mutants with Variable Pathogenicity Levels
N.I. Abu-Lail, B.-J. Park, Washington State University
9:40am AS+BI+NS-TuM6
First Observation of Charge reduction and Desorption Kinetics of Multiply Protonated Peptides Soft Landed onto Self-assembled Monolayer Surfaces
O. Hadjar, J.H. Futrell, J. Laskin, Pacific Northwest National Laboratory
10:40am AS+BI+NS-TuM9
Ultra Fast Mid Infrared Spectroscopic Imaging for Biomedical Applications
J. Phillips, H. Amrania, J. Plumridge, M. Frogley, Imperial College London, UK
11:00am AS+BI+NS-TuM10
X-ray Spectromicroscopy and Ion Spectroscopy to Evaluate a Blend of Poly(L)lactic Acid and Fluorine End-capped Poly(L)lactic Acid
D. Wells, J.A. Gardella, University at Buffalo
11:20am AS+BI+NS-TuM11
Influence of Molecular Environment on ToF-SIMS Detection of Bio-Active Molecules on Self-Assembled Monolayers
Z. Zhu, Pacific Northwest National Laboratory
11:40am AS+BI+NS-TuM12
Advances in Organic Depth Profiling Using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) under Optimized Ion Beam Conditions
H.-G. Cramer, T. Grehl, ION-TOF GmbH, Germany, N. Havercroft, ION-TOF USA Inc., F. Kollmer, R. Moellers, E. Niehuis, D. Rading, ION-TOF GmbH, Germany
12:00pm AS+BI+NS-TuM13
Fragment Free Mass Spectrometry for Bio-Molecular Surfaces with Size Selected Cluster SIMS
J. Matsuo, S. Ninomiya, K. Ichiki, Y. Nakata, T. Aoki, T. Seki, Kyoto University, Japan