AVS 54th International Symposium
    Thin Film Friday Sessions
       Session TF1-FrM

Paper TF1-FrM10
Reactive Sputtered SnO2 as the Active Layer in Transparent Thin Film Transistors

Friday, October 19, 2007, 11:00 am, Room 602/603

Session: Thin Films for Displays and Flexible Electronics
Presenter: W.-Y. Chen, National Cheng Kung University, Taiwan
Authors: W.-Y. Chen, National Cheng Kung University, Taiwan
J.-S. Chen, National Cheng Kung University, Taiwan
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Thin film transistors (TFTs) are the fundamental driving circuits for flat panel displays. In combination with the 'transparent circuit technology', transparent TFTs can increase the brightness and decrease the power consumption of displays. Therefore, oxide semiconductors are investigated as a substitute for the conventional amorphous silicon on TFTs because of their high optical transparency. In this work, we investigate the possibility of using reactive sputtered tin oxide (SnO2) as the active layer in transparent TFTs. The transmittance of as-deposited SnO2 film can reach 90%. Hall measurement shows that the SnO2 film has higher carrier mobility than amorphous silicon. By changing the Ar/O2 flow ratio during sputtering, the resistivity as well as the carrier mobility of SnO2 can be varied. With an adequate preparation condition, the reactive sputtered SnO2 film can lead to good characteristics as the active n-channel layer in transparent TFTs.