AVS 54th International Symposium
    MEMS and NEMS Tuesday Sessions
       Session MN-TuP

Paper MN-TuP10
Effect of Au Promoter Layers on NOx Sensitivity of Indium Oxide Solid State Sensor

Tuesday, October 16, 2007, 6:00 pm, Room 4C

Session: MEMS and NEMS Poster Session
Presenter: S. Kannan, University of Utah
Authors: S. Kannan, University of Utah
M. Sorenson, University of Utah
L.W. Rieth, University of Utah
F. Solzbacher, University of Utah
Correspondent: Click to Email

Stricter global emission regulations have generated an immediate need to develop high temperature compatible (>500°C) gas sensors for monitoring exhaust. Indium Oxide (In2O3) thin films with Au promoter layers have exhibited excellent sensitivity (S ~ 20) for detection of NOx at temperatures greater than 500°C. Gas sensitivity results will be interpreted as a function of In2O3 film structure and morphology. Thin film In2O3 layers (~150 nm) were RF sputter deposited in an ambient of pure argon (10 mtorr, 600 W, 2.4 nm/min) on Pt inter-digitated electrodes (IDE). Au promoter layers (~3nm) were deposited on top of the In2O3 film in a separate sputtering system. The thin films were annealed in nitrogen, oxygen, forming gas (2% H2 in Ar) or mixtures of nitrogen and oxygen up to 15 hours at temperatures from 700°C to 1000°C. X-ray diffraction (XRD) results reveal as-deposited and films annealed in oxygen have cubic crystallite structure with several reflections present. In2O3 films annealed in nitrogen show the presence of (321) (411) grains in addition to the as-deposited peaks. Atomic force microscopy (AFM) reveals as-deposited films having an average particle size of 25 nm (RMS = 1.5 nm) which increase to a particle size of up to 65 nm with annealing (RMS = 2.6 nm). These images also suggest all annealed samples with Au promoter change in morphology and increase roughness to 6.5 nm. X-ray photoelectron spectroscopy (XPS) revealed the annealed films to be In rich (45% In, 55% O). Films annealed in forming gas islanded exposing Si XPS peaks from the substrate.Four point probe measurements show the resistivity increase from as-deposited values of 0.0045 Ω-cm to larger than probe can measure(~ 7 Ω-cm) for forming gas annealed films and the results suggest the annealing ambient is important. In2O3 films were tested for gas sensitivity (S) towards NOx (0-25ppm), NH3 (25 ppm), CO2 (1000 ppm), H2 (5000 ppm) in synthetic air (80% N2, 20% O2) and nitrogen as carrier gas. In2O3 films with Au as a promoter annealed in N2 at 900°C for 5 hours exhibited excellent sensitivity (S~5) operating at 500°C and S~1 at operating temperature 650°C for detection of NOx. Sensitivity to NH3 as well as CO2 was low relative to NOx at 500°C and 650°C (S~0.1).