| AVS 66th International Symposium & Exhibition | |
| New Challenges to Reproducible Data and Analysis Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 1:40pm | RA+AS+NS+SS-MoA1 Invited Paper A Data-Centric View of Reproducibility Anne Plant, National Institute of Standards and Technology (NIST), J. Elliott, NIST, R. Hanisch, National Institute of Standards and Technology (NIST) |
| 2:20pm | RA+AS+NS+SS-MoA3 Invited Paper Enhancing Data Reliability, Accessibility and Sharing using Stealthy Approaches for Metadata Capture Steven Wiley, Pacific Northwest National Laboratory |
| 3:00pm | RA+AS+NS+SS-MoA5 Invited Paper From Electrons to X-rays: Tackling Big Data Problems through AI Mathew Cherukara, Y. Liu, M.V. Holt, H. Liu, T.E. Gage, J.G. Wen, I. Arslan, Argonne National Laboratory |
| 4:00pm | RA+AS+NS+SS-MoA8 Invited Paper Quantifying Shell Thicknesses of Core-Shell Nanoparticles by means of X-ray Photoelectron Spectroscopy Wolfgang Werner, Vienna University of Technology, Austria |
| 4:40pm | RA+AS+NS+SS-MoA10 Modeling the Inelastic Background in X-ray Photoemission Spectra for Finite Thickness Films Alberto Herrera-Gomez, CINVESTAV-Unidad Queretaro, México |
| 5:00pm | RA+AS+NS+SS-MoA11 R2R(Raw-to-Repository) Characterization Data Conversion for Reproducible and Repeatable Measurements Mineharu Suzuki, H. Nagao, H. Shinotsuka, National Institute for Materials Science (NIMS), Japan, K. Watanabe, ULVAC-PHI Inc., Japan, A. Sasaki, Rigaku Corp., Japan, A. Matsuda, K. Kimoto, H. Yoshikawa, National Institute for Materials Science (NIMS), Japan |