| AVS 66th International Symposium & Exhibition | |
| Surface Science Division | Tuesday Sessions |
| Session SS-TuP |
| Session: | Surface Science Poster Session |
| Presenter: | Zhuozhi Ge, Oak Ridge National Laboratory |
| Authors: | Z. Ge, Oak Ridge National Laboratory Q. Zou, Oak Ridge National Laboratory M. Fu, Oak Ridge National Laboratory L. Sanjeewa, Oak Ridge National Laboratory A. Sefat, Oak Ridge National Laboratory Z. Gai, Oak Ridge National Laboratory |
| Correspondent: | Click to Email |
Surface defects, including domain walls and individual atomic defects, can dramatically modify the properties of iron-based superconductors. However, the nature of domain walls and atomic defects on the surface of in-situ cleaved iron-based superconductors has yet to be identified. Here, we systematically investigated the surface defects on low-temperature cleaved parent and doped BaFe2As2 superconductors by scanning tunneling microscopy/spectroscopy (STM/S). STM imaging reveals two types of domain walls on parent and Ni/Co doped BaFe2As2, one as dark trench with missing atoms and the other as straightly aligned bright blobs. Two types of point defects are also identified, one intrinsically from growth or cleaving and the other induced by scanning of the STM tip. Tunneling spectroscopy shows similar surface states at about -200 meV on domain walls and the intrinsic point defects, while on the tip-induced defects there is only one peak at about -120meV.