AVS 66th International Symposium & Exhibition | |
Advanced Surface Engineering Division | Thursday Sessions |
Session SE-ThA |
Session: | New Challenges and Opportunities in Surface Engineering |
Presenter: | Robert Franz, Montanuniversität Leoben, Austria |
Authors: | A. Xia, Montanuniversität Leoben, Austria R. Franz, Montanuniversität Leoben, Austria |
Correspondent: | Click to Email |
Within the current work, the thermal stability of refractory MoNbTaVW HEA thin films was studied up to an annealing temperature of 1600 °C. The thin films with a thickness of about 1 µm were synthesized on sapphire substrates by cathodic arc deposition. The samples were annealed in a vacuum furnace for 1 hour at temperatures ranging from 1000 to 1600 °C in steps of 100 °C. After annealing, scanning electron microscopy images were recorded indicating changes in the film morphology at 1200 °C and above. Analysis by X-ray diffraction revealed the formation of new phases at 1500 °C. Nanoindentation tests were performed to assess possible changes in the mechanical properties of the films. A decrease from about 20 GPa for the as-deposited films to about 9 GPa after annealing at 1600 °C was noticed. The electrical conductivity of the MoNbTaVW thin film slightly decreased due to annealing as the measured resistivity increased from 5·10-7 Ωm to 1.5·10-6 Ωm.