AVS 66th International Symposium & Exhibition
    New Challenges to Reproducible Data and Analysis Focus Topic Wednesday Sessions
       Session RA+AS+CA+PS+TF-WeM

Paper RA+AS+CA+PS+TF-WeM10
Representativeness of a TEM image for Revealing New Phenomenon in Energy Storage Materials

Wednesday, October 23, 2019, 11:00 am, Room A124-125

Session: Reproducibility in Science and Engineering, Including Materials and Energy Systems
Presenter: Chongmin Wang, Pacific Norththwest National Laboratory
Authors: C. Wang, Pacific Norththwest National Laboratory
D.R. Baer, Pacific Northwest National Laboratory
Correspondent: Click to Email
Transmission electron microscopy (TEM), as a imaging technique with high spatial resolution, appears to be a routine tool for showcasing, often viewed as an enlightening figure, the structural and chemical information of materials at multiscale of down to single atomic column. One of a very common questions that raised by the viewer, not necessarily suspicious, is the representativeness of the image to the real situation as considering the sampling scale of the TEM imaging method. This question is further elevated for the case of in-situ and operando observation as which naturally couples in another dimension of “time” in addition to the “spatial” scale. In addition, beam effect can be coupled in for artifacts. In this presentation, we will check into the reproducibility of TEM imaging of both in-situ and ex-situ for revealing new phenomenon in energy storage materials, while certain cautions may also be necessary for interpreting new observations based on TEM.