Invited Paper NS-WeM10
Nanoscale Structural Imaging through Bragg Diffraction Microscopy

Wednesday, October 23, 2019, 11:00 am, Room A222

The development of x-ray nanobeam instrumentation at synchrotron x-ray light sources has created a wide range of opportunities in understanding nanoscale phenomena in materials science, chemistry, and condensed matter physics. Such instruments, including the Center for Nanoscale Materials/Advanced Photon Source Hard X-ray Nanoprobe (HXN) employ highly brilliant x-ray beams with focal spot sizes on the order of tens of nanometers and sufficient phase-coherent intensity to produce high-dynamic range scattering patterns from individual nanoscale objects. The far higher brilliance resulting from the APS Upgrade project promises to enable new classes of nanodiffraction experiment and to bring new challenges in the management and predictive analytic interpretation of large coherent scattering datasets. The scientific use of these instruments has required the creation of advanced x-ray analysis techniques based on combinations of coherent diffraction and ptychography with the unique optical conditions of tightly focused x-ray beams enabling correlation of structural and chemical mapping. The classes of scientific questions that are addressable by these techniques and the potential impact of diffraction limited storage rings such as the APS-Upgrade project will be explored within the context of recent results.