AVS 66th International Symposium & Exhibition | |
Nanometer-scale Science and Technology Division | Thursday Sessions |
Session NS-ThP |
Session: | Nanometer-scale Science and Technology Poster Session |
Presenter: | Sayantan Mahapatra, University of Illinois at Chicago |
Authors: | S. Mahapatra, University of Illinois at Chicago J. Schultz, University of Illinois at Chicago N. Jiang, University of Illinois at Chicago |
Correspondent: | Click to Email |
Conventional spectroscopic techniques are limited by the optical diffraction limit to about half wavelength and therefore offers about 200 nm х 200 nm microscopic zone for working in the visible light range. Tip-enhanced Raman spectroscopy (TERS) emerges as an advanced analytical technique, where the plasmonically active probe is not only used to detect the tunneling current but also to interrogate the local chemical environment of surface adsorbed molecules with angstrom scale precision. In this work, we studied two regioisomers (positional isomers), trans- and cis- tetrakispentafluorophenylporphodilactone (trans- and cis-H2F20TPPDL) using scanning tunneling microscopy (STM), ultrahigh vacuum (UHV) TERS on Ag(100) with the spatial resolution down to 8 Å, which has wide range of applications in various field of surface science & nanotechnology such as regioselective catalysis reaction, chemical reactions, molecular electronics etc. We have shown, it is possible to distinguish these two structurally very similar forms with high accuracy & precision. The two-component molecular junction has been identified using high resolution two-dimensional (2D) Raman mapping. Furthermore, these new class of porphyrinoids i.e. porphodilactones (PDL) have been studied on different single crystals [Ag(100), Cu(100) and Au(100)] to probe the intermolecular and molecule-substrate interactions. This work demonstrates, STM combined with TERS is a complementary technique to characterize a system completely at angstrom scale.