AVS 66th International Symposium & Exhibition
    Electronic Materials and Photonics Division Wednesday Sessions
       Session EM+2D+NS+TF-WeA

Paper EM+2D+NS+TF-WeA8
High Efficiency of Hot Electron Transfer at a Metal-Insulator-Semiconductor to Electrolyte Interface

Wednesday, October 23, 2019, 4:40 pm, Room A214

Session: THEME Session: Electronics and Photonics for a Low-Carbon Future
Presenter: Hyun Uk Chae, University of Southern California
Authors: H.U. Chae, University of Southern California
R. Ahsan, University of Southern California
Q. Lin, University of Southern California
R. Kapadia, University of Southern California
Correspondent: Click to Email

Hot electrons generated from metal has drawn considerable interest in recent years due to the potential for lowering the high-barrier chemical reactions. The majority of hot electron controlling strategy at present have been plasmonic devices using localized surface plasmon resonance (LSPR). Several works have been done using plasmons to induce the hot electron generation to use as catalysts for chemical reactions like hydrogen evolution reaction (HER). However, the efficiency of those devices is extremely low and the mechanism behind it is quite complicated and remain unclear until now. To take advantage of hot electrons efficiently, properly and simply designed devices are required. Here, we demonstrate the different mechanisms of hot electron transfer in a thin gold film in an Au-Al2O3-Si metal-insulator-semiconductor (MIS) junction by modulating Au film thickness, the applied voltage between Au-Si junction. Hot electron injection contributes to modifying the electron distribution inside the Au electrode, which enables HER to be driven more at same overpotential in solution. This work present that the injection of non-equilibrium electrons can shift the onset voltage of HER by ~0.6 V on the gold film in a 0.5 M H2SO4 solution. The efficiency of hot electron density efficiency shows ~85% at 2V of MIS junction bias and solution bias of -1.5 V vs Ag/AgCl is also presented. In addition to experimental results, we carried out the 2-D Monte Carlo simulation to track the injected hot electrons to study for the detail behaviors of thermalization mechanism inside the Au region which indicates the rate of HER. Since electrons quickly lose their energy within femtosecond by electron-electron or electron-phonon scattering, it is significant to see how they behave inside the injected medium to understand the reactions more precisely. The high-efficiency of hot electron usage reported here can be an opening towards the creation of practical hot-electron devices, which could be widely applied to the various fields.