AVS 66th International Symposium & Exhibition | |
Chemical Analysis and Imaging Interfaces Focus Topic | Wednesday Sessions |
Session CA+NS+SS+VT-WeA |
Session: | Chemical Analysis and Imaging of Liquid/Vapor/Solid Interfaces I |
Presenter: | Yehia Khalifa, Ohio State University |
Authors: | Y. Khalifa, Ohio State University A. Broderick, University of Delaware J.T. Newberg, University of Delaware Y. Zhang, University of Notre Dame E. Maginn, University of Notre Dame |
Correspondent: | Click to Email |