AVS 66th International Symposium & Exhibition
    Chemical Analysis and Imaging Interfaces Focus Topic Friday Sessions
       Session CA+AS+NS+SE+SS-FrM

Invited Paper CA+AS+NS+SE+SS-FrM11
Artificial Intelligence--An Autonomous TEM for In-situ Studies

Friday, October 25, 2019, 11:40 am, Room A226

Session: Novel Applications and Approaches in Interfacial Analysis
Presenter: Huolin Xin, University of California Irvine
Correspondent: Click to Email
Deep learning schemes have already impacted areas such as cognitive game theory (e.g., computer chess and the game of Go), pattern (e.g., facial or fingerprint) recognition, event forecasting, and bioinformatics. They are beginning to make major inroads within materials science and hold considerable promise for materials research and discovery. In this talk, I will introduce deep convolutional neural networks and how they can be applied to the computer vision problems in transmission electron microscopy. I will also discuss the development and application of liquid TEM to the study of solid/liquid interfaces at the nanoscale.