| AVS 66th International Symposium & Exhibition | |
| Applied Surface Science Division | Thursday Sessions |
| Session AS-ThA |
| Session: | Role of Surfaces and Interfaces in Energy Material and Industrial Problems |
| Presenter: | Michaeleen Pacholski, The Dow Chemical Company |
| Authors: | M.L. Pacholski, The Dow Chemical Company M.B. Clark, Jr., The Dow Chemical Company P.R. Vlasak, The Dow Chemical Company C. McMillan, The Dow Chemical Company |
| Correspondent: | Click to Email |
Surface analysts have a love-hate relationship with silicones. Silicones are widely used industrially for lowering surface energy, improving slip, coefficient of friction, mar and many other surface lubricity properties. Due to their low surface energies, and sometimes low viscosity or molecular weight, there is a tendency for them to spread over surfaces or be present as surface contaminants. In these cases a surface analyst may wish to remove them using a gas cluster ion beam source (GCIB). In other instances it may be desirable to understand the chemistry of a silicone coating as a function of depth. Unfortunately, GCIB profiling of silicones is not as straightforward as it is with other organic polymers.
Examples of depth profiles under different GCIB conditions from some reference silicones and silicone-containing coatings will be discussed in this presentation.