AVS 66th International Symposium & Exhibition
    2D Materials Wednesday Sessions
       Session 2D+AS+MI+NS-WeM

Paper 2D+AS+MI+NS-WeM2
Silicene like Domains on IrSi3 Crystallites

Wednesday, October 23, 2019, 8:20 am, Room A216

Session: 2D Materials Characterization by Scanning Probe Microscopy and Spectroscopy
Presenter: Nuri Oncel, University of North Dakota
Authors: N. Oncel, University of North Dakota
D. Cakir, University of North Dakota
F. Fatima, University of North Dakota
D. Nicholls, University of North Dakota
Correspondent: Click to Email
Recently, silicene, the graphene equivalent of silicon, has attracted a lot of attention due to its compatibility with Si-based electronics. So far, silicene has been epitaxially grown on various crystalline surfaces such as Ag(110), Ag(111), Ir(111), ZrB2(0001) and Au(110) substrates. Here, we present a new method to grow silicene via high temperature surface reconstruction of hexagonal IrSi3 nanocrystals. The h-IrSi3 nanocrystals are formed by annealing thin Ir layers on Si(111) surface. A detailed analysis of the STM images shows the formation of silicene like domains on the surface of some of the IrSi3 crystallites. We studied both morphology and electronic properties of these domains by using both scanning tunneling microscopy/spectroscopy and first-principles calculation methods.