AVS 66th International Symposium & Exhibition | |
2D Materials | Tuesday Sessions |
Session 2D+AS+MI+NS-TuM |
Session: | 2D Materials Characterization including Microscopy and Spectroscopy |
Presenter: | Sabine Neal, University of Tennessee Knoxville |
Authors: | S.N. Neal, University of Tennessee Knoxville H-S. Kim, Rutgers University K.A. Smith, University of Tennessee Knoxville A.V. Haglund, University of Tennessee Knoxville D.G. Mandrus, University of Tennessee Knoxville H.A. Bechtel, Advanced Light Source, Lawrence Berkeley National Laboratory G.L. Carr, National Synchrtoron Light Source II, Brookhaven National Lab K. Haule, Rutgers University D. Vanderbilt, Rutgers University J.L. Musfeldt, University of Tennessee Knoxville |
Correspondent: | Click to Email |