| AVS 65th International Symposium & Exhibition | |
| Applied Surface Science Division | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Invited Paper A Fistful of Data: The Good, the Bad and the Ugly of Quantitative Surface Analysis Alexander Shard, National Physical Laboratory, UK |
| 9:00am | AS-MoM3 XPS and the Reproducibility Crisis Donald Baer, M.H. Engelhard, Pacific Northwest National Laboratory |
| 9:20am | AS-MoM4 Rapid Calculation Method of the Voigt Function for Use in the Analysis of Photoelectron Spectroscopic Data Peter Sherwood, University of Washington |
| 9:40am | AS-MoM5 Statistical Analysis and Peak Fitting of X-ray Photoelectron Spectroscopy Data. Good Practices and Procedures for Working up this Information. Matthew Richard Linford, V. Jain, Brigham Young University |
| 10:00am | AS-MoM6 Modeling the Shirley Background Alberto Herrera-Gomez, D. Mulato-Gomez, Cinvestav-Unidad Queretaro, Mexico, A.D. Dutoi, University of the Pacific |
| 10:40am | AS-MoM8 XPS Spectra and Bonding In Ionic Transition Metal Compounds C. Richard Brundle, C. R. Brundle and Associates, P.S. Bagus, University of North Texas |
| 11:00am | AS-MoM9 Combinatorial Group XPS Analysis of Novel Material Systems Sarah Coultas, Kratos Analytical Ltd, UK, J.D.P. Counsell, Kratos Analytical Limited, UK, C. Moffitt, Kratos Analytical Inc., C.J. Blomfield, A.J. Roberts, Kratos Analytical Limited, UK |
| 11:20am | AS-MoM10 Towards Spatially Resolved Quantification of Gold Nanoparticles Embedded in an Organic Matrix using Secondary Ion Mass Spectrometry Shin Muramoto, J. Bennett, National Institute of Standards and Technology (NIST) |
| 11:40am | AS-MoM11 Correction-Free Analysis of SIMS Data at High Mass Resolution in the Presence of Detector Saturation Lev Gelb, A.V. Walker, University of Texas at Dallas |