AVS 65th International Symposium & Exhibition, Session AS+SE-ThM

AVS 65th International Symposium & Exhibition
Applied Surface Science Division	Thursday Sessions

Session AS+SE-ThM
Applied Surface Analysis of Novel, Complex or Challenging Materials

Thursday, October 25, 2018, 8:00 am, Room 204
Moderators: Michael Brumbach, Sandia National Laboratories, Thomas Grehl, IONTOF GmbH, Germany

Click here to Download program book for this session
in Adobe Acrobat format

Click a paper to see the details. Presenters are shown in bold type.

8:00am	AS+SE-ThM1 Invited Paper Understanding the Surface of Complex Oxides used in High Temperature Electrochemical Devices John Kilner, Imperial College London, UK, J.W. Druce, International Institute for Carbon Neutral Energy Research (I2CNER), Japan, H. Tellez, A. Staykov, International Institute for Carbon Neutral Energy Research (I2CNER)
8:40am	AS+SE-ThM3 Vectorial Method used to Monitor a XPS Evolving System: Titanium Oxide Thin Films under UV Illumination S. Bechu, Institut Photovoltaïque d’Ile-de-France, N. Fairley, Casa Software Ltd, UK, L. Brohan, Institut des materiaux Jean Rouxel, France, Vincent Fernandez, Université de Nantes, Institut des matériaux Jean Rouxel, France, M. Richard-Plouet, Institut des matériaux Jean Rouxel, France
9:00am	AS+SE-ThM4 XPS Characterization of Copper and Silver Nanostructures Tatyana Bendikov, M.D. Susman, F. Muench, A. Vaskevich, I. Rubinstein, Weizmann Institute of Science, Israel
9:20am	AS+SE-ThM5 Quantification of Hydroxyl, Major Element and Trace Element Concentrations in Oxide Glasses by Quadrupole SIMS. Albert Fahey, A.R. Sarafian, T. Dimond, Corning Inc.
9:40am	AS+SE-ThM6 Modification of Sputtered Carbon Surfaces in Biosensor Arrays Varun Jain, M.R. Linford, Brigham Young University
11:00am	AS+SE-ThM10 The Role of Surface Analysis in Characterization of Synthetic Opioids: TOF-SIMS imaging of Fentanyl and Fentanyl Analogs for Forensics and First Responder Safety Greg Gillen, S. Muramoto, J. Verkouteren, E. Sisco, National Institute of Standards and Technology (NIST)
11:20am	AS+SE-ThM11 3D TOF SIMS, Parallel Imaging MS/MS, and XPS Analysis of Glitterwing (Chalcopteryx rutilans) Damselfly Wings Ashley Ellsworth, D.M. Carr, G.L. Fisher, B.W. Schmidt, Physical Electronics, W.W. Valeriano, W.N. Rodrigues, UFMG, Brazil
11:40am	AS+SE-ThM12 Characterization of Aniline Dyes in the Modern Colored Papers and the Prints of José Posada J.K. Hedlund, L.D. Gelb, Amy Walker, University of Texas at Dallas
12:00pm	AS+SE-ThM13 GaAs and Si Surface Energies derived from Three Liquid Contact Angle Analysis (3LCAA), as a Function of Oxygen Coverage for Heterogeneous Nano-Bonding^TM Sukesh Ram, Arizona State University, K.L. Kavanagh, Simon Fraser University, Canada, F.J. Ark, C.E. Cornejo, T.C. Diaz, M.E. Bertram, S.R. Narayan, J.M. Day, M. Mangus, R.J. Culbertson, N. Herbots, Arizona State University, R. Islam, Cactus Materials, Inc.