| AVS 65th International Symposium & Exhibition | |
| Vacuum Technology Division | Monday Sessions |
| Session VT-MoM |
| Session: | Vacuum Measurement |
| Presenter: | Kevin Douglass, National Institute of Standards and Technology |
| Authors: | K.O. Douglass, National Institute of Standards and Technology J.E. Ricker, National Institute of Standards and Technology J. Hendricks, National Institute of Standards and Technology (NIST) |
| Correspondent: | Click to Email |
Towards the goal of quantum based traceability of the SI, NIST has developed an optical pressure standard where traceability is achieved through accurate quantum mechanical calculations of the refractive index and virial coefficients of helium. To achieve widespread adoption of this novel optical pressure measurement technology we leverage the various technologies that have been developed to support the telecommunications industry. We have begun characterizing the performance of our Fixed Length Optical Cavity (FLOC) at 1542 nm. At this wavelength an acetylene stabilized laser can be used to measure the wavelength to better than a ppm, which is one of the requirements of the measurement. The new optical setup and methodology for achieving high accuracy will be discussed along with future challenges and a detailed look at the sources of uncertainty and methods for calculating pressure from the change in refractive index.