| AVS 65th International Symposium & Exhibition | |
| Thin Films Division | Wednesday Sessions |
| Session TF+EM+MI-WeA |
| Session: | Thin Film Processes for Electronics and Optics II |
| Presenter: | Awais Ali, COMSATS Institute of Information Technology, Islamabad Pakistan |
| Authors: | A. Ali, COMSATS Institute of Information Technology, Islamabad Pakistan M. Alam, COMSATS Institute of Information Technology, Islamabad Pakistan S. Nasser, COMSATS Institute of Information Technology, Islamabad Pakistan N. Akbar, COMSATS Institute of Information Technology, Islamabad Pakistan A. Saeed, COMSATS Institute of Information Technology, Islamabad Pakistan A.S. Bhatti, COMSATS Institute of Information Technology, Islamabad Pakistan |
| Correspondent: | Click to Email |
In the present work, multifunctional/hybrid UV and IR sensing was performed by Nd doped TiO2 thin films. Thin films were sputter deposited and concentrations of dopants was varied in targets. The results suggested that the incorporation of Nd produced compressional stresses in lattice, which resulted in textured growth and asymmetry of bonds as confirmed by XRD and Raman spectroscopy. The dopant driven non-stoichiometry and presence of O vacancies was evident from XPS measurements. The defects and dopant mediated luminescence was obtained in visible and IR regions, respectively. The sensing of UV light was attributed to the host (titania), whereas successful incorporation of dopant helped in sensing IR source.