| AVS 65th International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Thursday Sessions |
| Session SA+AS+HC+SS-ThA |
| Session: | IoT Session: Multi-modal Characterization of Energy Materials & Device Processing |
| Presenter: | Ruimin Qiao, Lawrence Berkeley National Laboratory |
| Authors: | R. Qiao, Lawrence Berkeley National Laboratory J.-H. Guo, Lawrence Berkeley National Laboratory W. Chao, Lawrence Berkeley National Laboratory |
| Correspondent: | Click to Email |
Soft X-ray spectroscopy (∼50-1500eV), including both X-ray absorption and emission, is a powerful tool to study the electronic structure of various energy materials. Its energy range covers the K-edge of low-Z elements (e.g. C, N, O and F) and the L-edge of transition metal. Important information such as chemical valence, charge transfer and different ligand field could be directly extracted from the spectra. However, its application has been largely limited in materials that could be placed in vacuum (such as solid, below-ambient-pressure gas and liquid) because of the short penetration depth of soft x-ray. In this presentation, I will talk about the recent development of soft x-ray spectroscopy for high pressure liquid(up to 400 bars) at Advanced Light Source in Lawrence Berkeley National Lab.