AVS 65th International Symposium & Exhibition | |
Nanometer-scale Science and Technology Division | Thursday Sessions |
Session NS+2D+AS+MN+PC-ThA |
Session: | SPM – Probing Electronic and Transport Properties |
Presenter: | Anna Roslawska, Max Planck Institute for Solid State Research, Germany |
Authors: | A. Roslawska, Max Planck Institute for Solid State Research, Germany P. Merino, Max Planck Institute for Solid State Research, Germany C. Grosse, Max Planck Institute for Solid State Research, Germany C.C. Leon, Max Planck Institute for Solid State Research, Germany O. Gunnarsson, Max Planck Institute for Solid State Research, Germany M. Etzkorn, Max Planck Institute for Solid State Research, Germany K. Kuhnke, Max Planck Institute for Solid State Research, Germany K. Kern, Max Planck Institute for Solid State Research, Germany |
Correspondent: | Click to Email |
The performance of organic optoelectronic devices depends on the dynamics of charges and excitons (electron-hole pairs). The relevant processes have been mostly studied by time-resolved techniques with a spatial resolution limited by optical diffraction. In order to overcome this limit, a nanoscale scanning probe approach that enables addressing individual light emitters is preferred. Here we introduce time-resolved scanning tunneling microscopy-induced luminescence (TR-STML) and use it to explore locally the single charge and single exciton regime. The excitonic light originates from structural defects in C60 thin films on Au(111) that act as charge and exciton traps. Such a defect is a single photon emitter, whose spectrum has a sharp electron-hole recombination feature [1,2]. By measuring the time-resolved electroluminescence due to individual injected charges, it is possible to analyze the formation and recombination processes of single excitons and determine their characteristic time constants[3].
[1] P. Merino, C. Große, A. Rosławska, K. Kuhnke, K. Kern, , Nat. Commun., 6, 8461, 2015.
[2] C. Große, P. Merino, A. Rosławska, O. Gunnarsson, K. Kuhnke, K. Kern, ACS Nano, 11, 1230-1237, 2017.
[3] A. Rosławska, P. Merino, C. Große, C. C. Leon, O. Gunnarsson, M. Etzkorn, K. Kuhnke, K. Kern, arXiv:1803.10088.