AVS 65th International Symposium & Exhibition | |
Nanometer-scale Science and Technology Division | Thursday Sessions |
Session NS+2D+AS+MN+PC-ThA |
Session: | SPM – Probing Electronic and Transport Properties |
Presenter: | Daniel Walkup, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park |
Authors: | D. Walkup, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park C. Gutierrez, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park F. Ghahari, National Institute of Standards and Technology (NIST)/ University of Maryland, College Park C. Lewandowski, MIT J. Rodriguez-Nieva, Harvard University T. Taniguchi, National Institute for Materials Science (NIMS), Japan K. Watanabe, National Institute for Materials Science (NIMS), Japan L. Levitov, MIT N.B. Zhitenev, National Institute of Standards and Technology (NIST) J.A. Stroscio, National Institute of Standards and Technology (NIST) |
Correspondent: | Click to Email |