AVS 65th International Symposium & Exhibition | |
Nanometer-scale Science and Technology Division | Wednesday Sessions |
Session NS+2D+AN+MN+MP+SE-WeM |
Session: | Micro, Nano and Opto Mechanics |
Presenter: | Le Li, Boston University |
Authors: | L. Li, Boston University N. Alsharif, Boston University K.A. Brown, Boston University |
Correspondent: | Click to Email |
Elastomers are fascinating materials owing to the fact that their mechanical properties are dictated by entropy. Due to their low modulus, chemical compatibility, and ease of processing, they are widely applied in fields from soft lithography to medical devices. While it is well accepted that they exhibit fascinating size-dependent mechanical properties when confined to thin films, the structure-property relationships that govern confined elastomers are difficult to unambiguously determine due to the mechanical influence of rigid support structures and unavoidable contributions from adhesion. As a result, a consensus regarding the moduli of elastomeric thin films has not emerged. Here, we present a combined computational and experimental approach to measure the true mechanical properties of thin elastomer films. First, we utilize extensive finite element simulations to determine a correction to the Hertzian contact model that depends upon a dimensionless film thickness and the polymer Poisson’s ratio. In order to verify this correction, films composed of three different thermoplastics were studied using an atomic force microscopy (AFM) nanoindenting. Interestingly, all three were observed to soften when confined to films thinner than 100 nm, in agreement with literature reports of buckling experiments. To explore softer elastomeric materials that exhibit categorically different behavior, we extended this correction to the Johnson-Kendall-Roberts (JKR) model that considers adhesion in contact mechanics. Elastomer thin films with different crosslink densities were studied using AFM nanoindentation and finite element simulation to determine their moduli. We observed a drastic stiffening on all elastomeric films when they were confined to sub-micrometer thicknesses. More importantly, modulus of all sub-100 nm elastomer films converges to the same trend regardless of bulk crosslink density. We present a hypothesized molecular model explaining this behavior. These results shed new light on the nanomechanics of elastomers and provide a general process for exploring size-dependent mechanics in polymers.