| AVS 65th International Symposium & Exhibition | |
| Manufacturing Science and Technology Group | Tuesday Sessions |
| Session MS-TuP |
| Session: | Topics in Manufacturing Science and Technology Poster Session |
| Presenter: | Vincent Smentkowski, General Electric Global Research Center |
| Authors: | V.S. Smentkowski, General Electric Global Research Center R. Davis, General Electric Global Research Center J. Murphy, General Electric Global Research Center A. Setlur, General Electric Global Research Center M. Butts, General Electric Global Research Center J. Lu, General Electric Global Research Center W. Beers, Current by GE |
| Correspondent: | Click to Email |
Over the past decade significant improvements have been made in phosphor technology resulting in improved brightness, color gamut, lifetime and reliability in order to meet market demands for next generation LED Lighting and display technologies. Over 20 billion K2SiF6:Mn4+ containing LEDs have been sold into the display industry in less than 4 years under GE RadiantRED™ Technology.
Achieving these demands require the development of accurate, and reproducible methods to characterize and monitor the microstructure, surface, subsurface, and bulk chemistry of the phosphor powders (including dopants such as Mn4+). In this poster we will highlight a sub set of the novel analytical techniques we developed with an emphasis on the analysis of dopants and their three dimensional distribution in the phosphor powders. The criticality of sample handling and preparation for accurate analysis will be addressed.