AVS 65th International Symposium & Exhibition | |
MEMS and NEMS Group | Thursday Sessions |
Session MN+2D+AN+NS-ThA |
Session: | Nonlinear and Thermal Resonators |
Presenter: | Utku Hatipoğlu, Bilkent University, Turkey |
Authors: | S.O. Erbil, Bilkent University, Turkey U. Hatipoğlu, Bilkent University, Turkey C. Yanık, Sabancı University M. Ghavami, Bilkent University, Turkey M.S. Hanay, Bilkent University, Turkey |
Correspondent: | Click to Email |
Here, we demonstrate a buckling based, nanoelectromechanical logic bit with high controllability and low logic input voltage. The device consists of a slender beam to store information through its buckling direction and a comb-drive structure for initiating buckling electrostatically. When an actuation voltage is applied to the fingers of the comb-drive structure, an axial compressive force is applied to the suspended slender beam which is connected to an anchor from the opposite end. Applied axial force creates a compressive stress on the slender beam which leads to buckling after a critical load. Buckling direction can be controlled (left/right) by changing the applied side-gate control voltages. The capacitive attraction force generated between the beam and the activated electrode controls the direction of the buckling. Control voltage acts as the logic input for writing information and it is only required just before the application of the axial load, so that the beam can be preloaded to the target direction. Lateral deformations as large as 10% of the beam length can be achieved.
Once the beam is buckled to the desired direction, the removal of the guidance voltage does not affect the buckling state of the beam, which indicates successful non-volatile information storage. Moreover, by altering the voltage difference created in the comb-drive structure, buckling amount can be controlled very precisely. Control voltages as low as 0.5V are demonstrated for storing information. The device is fabricated from an SOI wafer by using electron beam lithography, metal deposition and plasma / HF etching techniques. The dimensions of the slender beam are 150nm x 250nm x 40µm for the width, thickness and length respectively. Several videos demonstrating dynamically controlled electrostatic buckling have been recorded during the experiments. The nanoelectromechanical logic memory demonstrated here is scalable since its operation does not require any high-end electronic instruments such as function generators, and can be accomplished by simply using DC power sources. To readout the state of the beam all-electronically, the device is capacitively coupled to a microwave resonator. The changes in the frequency shows clear transitions between buckled and straight states.
It is possible to build two-bit mechanical logic gates and more involved logic units by using proposed nanoelectromechanical logic bit. As a further matter, precise control of the buckling in nanoscale can be very promising for demonstrating the interconnection between information science and thermodynamics.