| AVS 65th International Symposium & Exhibition | |
| Exhibitor Technology Spotlight Workshops | Wednesday Sessions |
| Session EW-WeL |
| Session: | Exhibitor Technology Spotlight Session V |
| Presenter: | Markus Maier, Scienta Omicron GmbH, Germany |
| Correspondent: | Click to Email |
The TESLA JT SPM provides access to more than 5 days SPM measurement time at temperatures down to 1K (4He
operation) with magnetic fields larger than B > 3T. Careful thermal design of the bath cryostat and JT cooling stage
as well as the integrated UHV magnet lead to exceptionally low LHe consumption of only 11 liters LHe for 120
hours, specifically also during magnet operation and field variation. The external JT Helium supply allows for 3He
operation and significantly lower temperatures in the range of 500mK.
The microscope head is a proven, highly stable design developed specifically for high magnetic field environments.
It offers the full range of SPM measurements modes, including Scienta Omicron’s leading QPlus AFM technology.
Safe and independent tip/sample exchange under optical control is one of several key ease-of-use features delivering
dependable high performance SPM and successful scientific work.
In contrast to a conventional wet magnet concept, the dry split-pair magnet provides for optical access enabling
various optical experiments and even in-situ evaporation into the SPM at low temperatures.
We will discuss the technical concept and will show performance evaluation measurements at T=1K that prove
stability below 1pm as well as energy resolution on superconductors.
Specifically, continuous STM and QPlus AFM imaging at varying temperatures during magnetic field ramping
without increasing the LHe consumption differentiate the concept from traditional 4He and 3He systems and open
up new experimental possibilities.