AVS 64th International Symposium & Exhibition
    Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic Tuesday Sessions
       Session SA+MI-TuM

Invited Paper SA+MI-TuM10
Ultrafast X-ray Scattering Studies of Light-induced Processes in 2D Materials

Tuesday, October 31, 2017, 11:00 am, Room 9

Session: Overcoming the Temporal and Spatial Limits of X-Ray Scattering Methods for In-Situ Analysis
Presenter: Edbert Sie, Stanford University
Authors: A. Lindenberg, Stanford University
E. Sie, Stanford University
Correspondent: Click to Email
Novel characterization techniques developed over the past two decades have revolutionized our ability to visualize the microscopic, atomic-scale processes that determine the functional properties of materials. The overarching challenge here is that the relevant time-scales and length-scales for these processes are typically 10-13 seconds (100 femtoseconds) and 10-10 m (1 Å) such that our view of how a material functions is often blurred out in time or in space. In this talk I will describe recent experiments using femtosecond x-ray pulses as a means of probing and manipulating the optoelectronic and structural properties of materials on ultrafast time-scales, as they transform and in-situ. I will focus in particular on recent experiments probing dynamic deformations of multilayer transition metal dichalcogenide films on femtosecond and picosecond time-scales. These studies reveal a surprising light-induced nonlinear modulation in the interlayer bonding, associated with manipulation of the Casimir/van der Waals interaction between quasi-2D layers.