AVS 63rd International Symposium & Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions

Session EW-WeM
Exhibitor Technology Spotlight Session

Wednesday, November 9, 2016, 8:00 am, Room Hall C
Moderator: Chris Moffitt, Kratos Analytical Limited

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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

10:20am EW-WeM8
From Surface Spectrometry to 3D Analysis - Latest Trends and Instrumentation for TOF-SIMS
Nathan Havercroft, ION-TOF USA, R. Moellers, A. Pirkl, ION-TOF GmbH, Germany